Cobham RAD Solutions

Comprehensive radiation effects test and support laboratories offering the following capabilities, services and standard products for HiRel, Military and Space applications.

Contact: 800-645-8862

Cobham RAD Single Event Effects (SEE) Testing

Device Preparation

Cobham RAD has extensive experience in performing Single Event Effect tests. Many of our staff have over 25+ years of experience in the relatively unique and specialized field of single event effects in electronics. This experience, combined with the many hundreds of tests we have performed, has led to the development of a library of hardware and software techniques which help reduce the cost and time required to successfully complete an SEE test.

We offer turnkey solutions to efficiently determine heavy ion cross sections for a given component or system from diodes to FPGAs and DSPs. Our services include:

  • Device Preparation — thinning, back side thinning and packaging if required
  • Design and Development of test hardware & software
  • Optimized test planning and management for efficient use of the cyclotron
  • Comprehensive SEE test reports and data collection
SEE Testing

Tests can be designed to evaluate:

  • Single Event Latch Up (SEL)
  • Single Event Upset (SEU)
  • Single Event Transients(SET)
  • Single Event Burnout (SEB)
  • Single Event Functional Interrupts (SEFI)
  • Single Event Gate Rapture (SEGR)
    • EIA/JESD 57
    • ASTM F1192

SEE Testing of memory devices, including NAND, SDRAM and DDR, is efficiently performed using our FPGA based test solutions. The majority of SEE tests are conducted using cyclotrons at either Lawrence Berkeley National Laboratory (LBNL) or at Texas A&M University (TAMU) and on occasion at Brookhaven National Laboratory (BNL).